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Washington State University Institute of Materials Research

Infrared Microscopy

This is a Depth of Field (DOF) transmission imaging system for mapping Te inclusions in CdZnTe samples. Light source of wavelength ~850 nm, that passes through CdZnTe but blocked by the trapped Te inclusion.  Sample is placed on an automated X-Y-Z translation system for large area mapping. Imagepro is used to control the data acquisition and analyze the acquired images.