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Washington State University Institute of Materials Research

Infrared Microscopy

This is a Depth of Field (DOF) transmission imaging system for mapping Te inclusions in CdZnTe samples. A light source of infrared wavelength (we have two choices, 845 nm and 941 nm depending on the bandgap) passes through Cd-Zn-Te but is blocked by the more infrared opaque Te inclusions.  The sample is placed on an automated X-Y-Z translation system for large area mapping. Imagepro is used to control the data acquisition and analyze the acquired images.