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Washington State University Institute of Materials Research

Mobility-Lifetime (μτe) Measurement

A modular setup for measuring the (μτe) products of thin CdZnTe detectors. This a versatile setup consisting of a series of amplifiers and shaping modules to modify the signals that are fed through a Multichannel Analyzer for discriminating the energies form incoming radiation sources. Hecht relationship is used to measure the mu-tau of thin detectors (1-2 mm) where the drift of the peak channel is measured relative to the applied electric field, curve fitting is then utilized to estimate the mu-tau. Power supply is capable of sourcing voltages from -1100 V to 1100 V and detector currents are limited to <50 nA (compliance set on power supply) for accurate measurements.