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Washington State University Institute of Materials Research

Thermally Stimulated Luminescence

Thermally Stimulated Luminescence (TSL) systems capable of measurements from 20 – 673K.

Two TSL systems, one capable of 20 K – room temperature and the other capable of room temperature – 673 K measurements, are useful for characterizing defects in materials.  The detector can collect 400 – 1300 nm light, which is normally integrated and plotted against temperature to investigate detrapping.